Thermal and stress analysis of heterojunction bipolar transistor

Member of
FAU Theses and Dissertations
Contributors
Rivero, Jose Fernando.
Tsai, Chi-Tay
Publisher
Florida Atlantic University
Date Issued
2001
Description
The objective of this work is to perform the current induce thermal stress analysis of heterojunction bipolar transistor and to determine the implications of the variation of the thermal shunt thickness. A thesis presented on multi-physics using finite element analysis, covering fluid, thermal and stress with fatigue life analysis of a microelectronic heterojunction bipolar transistor.
Note

College of Engineering and Computer Science

Language
English
Type
Text
Genre
Electronic Thesis or Dissertation
Form
application/pdf
Extent
196 p.
Subject (Topical)
Junction transistors
Thermal analysis
Identifier
9780493398891
ISBN
9780493398891
Rights

http://rightsstatements.org/vocab/InC/1.0/

Additional Information
College of Engineering and Computer Science
FAU Electronic Theses and Dissertations Collection
Thesis (M.S.)--Florida Atlantic University, 2001.
Date Backup
2001
Date Text
2001
Date Issued (EDTF)
2001
Extension


FAU
FAU
admin_unit="FAU01", ingest_id="ing1508", creator="staff:fcllz", creation_date="2007-07-18 21:57:31", modified_by="staff:fcllz", modification_date="2011-01-06 13:08:51"

IID
FADT12834
Issuance
monographic
Organizations
Attributed name: Florida Atlantic University
Attributed name: College of Engineering and Computer Science
Attributed name: Department of Ocean and Mechanical Engineering
Person Preferred Name

Rivero, Jose Fernando.
Graduate College
Physical Description

196 p.
application/pdf
PURL
http://purl.flvc.org/fcla/dt/12834
Related Item


Florida Atlantic University Digital Library Collections


40-02.

Title Plain
Thermal and stress analysis of heterojunction bipolar transistor
URL
http://purl.flvc.org/fcla/dt/12834
Use and Reproduction
Copyright © is held by the author, with permission granted to Florida Atlantic University to digitize, archive and distribute this item for non-profit research and educational purposes. Any reuse of this item in excess of fair use or other copyright exemptions requires permission of the copyright holder.
http://rightsstatements.org/vocab/InC/1.0/
Origin Information

2001
monographic

Boca Raton, Fla.

Florida Atlantic University
Physical Location
Florida Atlantic University Libraries
Place

Boca Raton, Fla.
Sub Location
Digital Library
Title
Thermal and stress analysis of heterojunction bipolar transistor
Other Title Info

Thermal and stress analysis of heterojunction bipolar transistor