Integrated circuits--Fracture

A study of the stress distribution in and fracture behavior of the hermetic glass seal in a typical Integrated Circuit package is presented herein. Finite Element Analysis and Fracture Mechanics approaches were found effective for this investigation. A prescribed load or displacement applied at the tip of the lead protruding from the package causes high stresses at the lead-glass interface, which can lead to cracking and fracture of the seal. An approach for finding the value of the allowable load or displacement applicable at the lead tip is discussed. A correlation with a standard crack shape is presented for the 3-D model of the package. An extension of the problem revealing the effects of crack propagation on the stress intensity factor for the glass material is presented in later chapters. The J-integral method from Fracture Mechanics is found to be extremely useful for this investigation. A decline in the stress intensity factor with crack growth was observed from this study.